000 00348nam a22001337a 4500
008 250304b |||||||| |||| 00| 0 eng d
020 _a9783527335015
050 _aTK7875
_b.R43
100 _aTabata Osamu
245 _aReliability of MEM'S Testing of Materials and Divices
260 _aGermany
_bWiley-WCH
_c2013
300 _aXX,303P
942 _cBK
999 _c2087
_d2087